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March 30, 2006

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Follow the optical density question, I have a similar issue of measuring the density of Ni layer on Tin. Can anyone tell the equipment to be used and give out more the experimental details?
Thank you for your attention.

at what wave length?

Relative to the Ni layer on Tin, You might be able to do a simple difference technique if the optical density ranges are in a good range. this might also require the use of a higher power light source, perhaps a laser. In principle an elipsometer might be used but might be difficult to use in a chamber and would be an off line measurement. You could also make use of a reflection of a circularly polarized light beam (can be purchased as a laser source) off the Ni layer and measuring the change in polarization which will occur on the reflection, either as a change in intensity or the angle of polarization. It should be possible to develop the correlation between the Ni thickness and the change in the light reflection.

Alternative would to look for interference effects in transmitted or reflected light which would be related to Tin and Ni layer thicknesses and refractive indexes.

albedo=s/(s+k)
s scattering coefficient
k absorption coefficient
optical density=(k+s)*Z =log10(1/T) ?
Z is the film thickness
How to calculate the k & s of a film using two reflectance of film over white and over black substrate

Thanks in advance

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